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Optimal reliability design: Fundamentals and applications Kuo Way; Prasad V Rajendra; Tillman Frank A; Hwang Ching-Lai

By: Contributor(s): Material type: TextTextLanguage: English Publication details: Cambridge Cambridge University Press 2001Description: xxi,389p. cm. illISBN:
  • 0521781272 (hbd)
Subject(s): DDC classification:
  • B2T0bD:4, P1;1
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Item type Current library Home library Call number Status Barcode
Textual Textual Central Science Library Central Science Library B2T0bD:4 P1;1 (Browse shelf(Opens below)) Available SL1175585

Appendix A1-A4, 358-366p; Bibliographical references 367-384p. cm.; Index 385-389p. cm.

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