Optimal reliability design: Fundamentals and applications Kuo Way; Prasad V Rajendra; Tillman Frank A; Hwang Ching-Lai

By:

Contributor(s):

Material type: Text

TextLanguage: English Publication details: Cambridge Cambridge University 2001Description: xxii,389p. illISBN:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Home library	Call number	Status	Barcode
Textual	Central Science Library	Central Science Library	B2T0bD:4 P1;4-;5 (Browse shelf(Opens below))	Available	SL1561286

Appendix 358-366p.; References 367-384p.; Index 385-389p.

There are no comments on this title.

to post a comment.