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Applied logistic regression Hosmer David W; Lemeshow Stanley; Sturdivant Rodney X

By: Contributor(s): Material type: TextTextLanguage: English Series: Wiley series in probability and statisticsPublication details: Hoboken Wiley 2013Edition: 3Description: xvi,510pISBN:
  • 9780470582473 (hbk)
  • SL01560349
Subject(s): DDC classification:
  • B28, P0;Q3 TB
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Item type Current library Home library Call number Status Barcode
Textbook Textbook Central Science Library Central Science Library B28 P0;Q3 TB (Browse shelf(Opens below)) Available SL1560349

References 459-478p.; Index 479-500p.

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