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Fundamentals of nanoscale film analysis by Alford Terry L; Feldman Leonard C; Mayer James W

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New York Springer 2007Description: xiv,336p. cmISBN:
  • 9780387292601 (hbd)
Subject(s): DDC classification:
  • C21:(D), P7
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Item type Current library Home library Call number Status Barcode
Textual Textual Central Science Library Central Science Library C21:(D) P7 (Browse shelf(Opens below)) Available SL1380014

Includes bibliographical references; Appendix 1-13 291-329p; Index 330-336p

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