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Scanning electron microscopy and X-ray microanalysis Goldstein Joseph I.; Newbury Dale E.; Echlin Patrick; Joy David C.; Lyman Charles E.; Lifshin Eric; Sawyer Linda; Michael Joseph R.

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New York Kluwer Academic/Plenum Publishers 2003Edition: 3Description: xix, 689p. cm. Includes with CD-ROMISBN:
  • 0306472929 (hbd)
DDC classification:
  • G:1996, P3 TH
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Item type Current library Home library Call number Status Barcode
Textbook Textbook Central Science Library Central Science Library G:1996 P3 TH (Browse shelf(Opens below)) Available SL1288764

Includes bibliographical references; Index 675-689p

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