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1.
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Applied logistic regression Hosmer David W; Lemeshow Stanley; Sturdivant Rodney X by Series: Wiley series in probability and statistics
Edition: 3
Material type: Text Text; Format: print regular print ; Literary form: Not fiction
Language: English
Publication details: Hoboken Wiley 2013
Availability: Items available for loan: Central Science Library (1)Collection, call number: B28 P0;Q3 TB.

2.
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Applied logistic regression by Hosmer David W; Lemeshow Stanley by Series: Wiley series in probability and statistics
Edition: 2
Material type: Text Text; Format: print regular print ; Literary form: Not fiction
Language: English
Publication details: New York John Wiley 2000
Availability: Items available for loan: Central Science Library (1)Collection, call number: B28 P0.

3.
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Applied survival analysis HOSMER David W; LEMESHOW Stanley; MAY Susanne Regression modeling of time- to- event data by
Edition: 2nd
Material type: Text Text; Format: print regular print ; Literary form: Not fiction
Language: English
Publication details: New York Wiley- Interscience 2008
Availability: Items available for loan: Ratan Tata Library (1)Collection, call number: X:(B2898) P8.