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Electron nano-imaging: Basics of imaging and diffraction for TEM and STEM Tanaka Nobuo

By: Material type: TextTextLanguage: English Publication details: Japan Springer 2017Description: xxviii, 333p. ill. cmISBN:
  • 9784431565000 (hbk)
Subject(s): DDC classification:
  • E:(G:1996), Q7
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Holdings
Item type Current library Home library Call number Status Barcode
Textual Textual Central Science Library Central Science Library E:(G:1996) Q7 (Browse shelf(Opens below)) Available SL1601926

Appendix 219-312p.; Author index 313-315p.; Subject index 317-333p.

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